ITC55100C/55300C 雪崩测试系统

test modes

• Single-Pulse Unclamped Inductive Switching (UIS)

• Single-Pulse Avalanche Stress (EAS)

• Repetitive Avalanche Energy (EAR)

• Repetitive Pulse to Failure (RPF)

features

• Single/Dual Device Testing

• N channel, P channel, Mixed

• All Solid State Switching – No Relays

• Timing Resolution of 40ns

• Current Range: 0.1A to 200A, 0.1A Steps

• Avalanche Voltage to 2500V

• Bipolar Gate Drive with 30V swing

• New High Efficiency Kelvin Circuit

• Touch-Screen Program Entry/Control

• Waveform Capture/Display

• Internal Test Program Storage (20 files)

• High Speed Inductor Charging, Reduces Test Time

• Programmable Leakage Test Voltage

• Pre/Post Avalanche Leakage Test

• Avalanche Collapse Test

• Versatile Test Handler Control

• Up to 15 Hardware Sort Bins

• Improved Voltage/Current Accuracy

• Software Updates via Flash Download

• Password Control of Parameter Entry

• Operates with all ITC Inductor Load Boxes

• Interfaces with ITC55MUX4 & ITC55-RSF

• Simple, Complete User Calibration

• Built-in Self Test