ITC57300 分立器件动态参数测试系统

capabilities

• Test voltage: maximum of 1200 Vdc at 200 A

(Isc up to 1000A)

• Timing Measurement: minimum of 1 ns

• Drain Current Limit Monitor

test heads

• ITC57210 - R Switching Time for N- and P-channel

Power MOSFETs, MIL-STD-750, Method 3472

• ITC57220 - Trr/Qrr for power MOSFETs and Diodes,

MIL-STD-750, Method 3473

• ITC57230 - Gate Charge for power MOSFETs,

MIL-STD-750, Method 3471

• ITC57240 Inductive switching time for IGBT,

MIL-STD 750, Method 3477

• ITC57250 Short circuit (Isc) withstand time,

MIL-STD 750, Method 3479

• ITC57260 - Gate Resistance (Rg), Input Capacitance

(Ciss), Output Capacitance (Coss), and Reverse

Capacitance (Crss) for Power MOSFET’s,

JEDEC standard JESD24-11

system features

• Easily Changeable Test Heads

• Automated Testing of Different Parameters

• Ruggedized PC Compatible Computer

• User-Friendly Menu Driven Software

• Programmable Test Output Bins

• Spreadsheet Compatible Test Data

• Selectable Internal Inductance Loads

• GPIB Programmable Test Equipment

• Four channel high bandwidth Digitizing Oscilloscope

• Pulse Generator

• 1200V Power Supply